Atomic force microscopy (AFM) permits the characterization not only of nanoscale topography and mechanical properties, but also of electric and magnetic properties. AFM modes available for this purpose include electric force microscopy (EFM), magnetic force microscopy (MFM), and scanning electrostatic potential microscopy (SEPM). With its two integrated dual lock-in amplifi ers and a powerful software package, the CaliberTM system offers all of these modes as standard features. By detecting magnetic and electric fi eld gradients near the sample surface and measuring the local electrostatic potential, these AFM modes enable applications such as failure analysis of semiconductor devices and data storage media, detection of trapped charges, determination of contact potentials, mapping strength and direction of electric polarization, mapping magnetic domains, and detecting the presence of conductive components in composite samples. DI Caliber 掃描探針顯微鏡