全文請訪問：http://www.spm.com.cn/papers/p96.pdf
Recording at a nanometer-scale on 3-phenyl-1-ureidonitrile(CPU)thin films is successfully conducted using scanning tunne領(lǐng) microscopy(STM)in ambient conditions.Recorded marks are written when a series of voltage pulses are applied between the STM tip and the freshly cleaned highly ordered pyrolytic graphite(HOPG)substrates.STM current-voltage(1-V) curves of the films show that the electric resistance in the recorded regions is much lower than that in the unrecorded regions.Standard four-point probe meansurements indicate that the transition time of the transient conductance is 6 ns.It is suggested that CPU organic thin films have potential in the application of future data storage. 全文請訪問：http://www.spm.com.cn/papers/p96.pdf 掃描探針顯微鏡(SPM/AFM/STM)