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槍擊殘留物的X射線微區(qū)分析
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槍擊殘留物的X射線微區(qū)分析
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槍擊殘留物的X射線微區(qū)分析- 槍擊殘留物的X射線微區(qū)分析[詳細(xì)]
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安裝說明
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- 對(duì)珍珠的X射線微區(qū)分析(X射線分析顯微鏡)
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期刊論文
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- IXRF在槍擊殘留物分析的應(yīng)用
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其它
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- 微區(qū)XRF（X射線分析顯微鏡）的指紋圖像
- 微區(qū)XRF（X射線分析顯微鏡）的指紋圖像[詳細(xì)]
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2010-03-23 00:00
選購(gòu)指南
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- 微區(qū)XRF（X射線分析顯微鏡）分析寶石夾雜物
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專利
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- 微區(qū)XRF（X射線分析顯微鏡）分析金屬磨損物
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專利
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- 礦石應(yīng)用-布魯克微區(qū)X射線熒光
- Stateoftheartmicro-XRFappliedtogeologicalsamplesMicro-XRFongeologicalsamplesM4TornadoLargesamples(H×W×D:200mm×160mm×120mm)Powerfulsamplestage(100mm/s,5kg)Pre-VacuumconditionsfordetectionofelementsdowntoNaPolycapillaryopticsforhighexcitationintensityandspotsize＜25μmSDDsfordetection/processingofover100kcpsVariousmeasurementmodes(single-ormulti-point,linescans,areascans)Optional2ndX-raytubeOptional2nddetectorPositionTaggedSpectroscopy(HyperMap)Versatile"data-mining"softwareStandard-freequantificationScanoftheCetaceous/PaleogeneboundaryinRatonBasinUSThinsectionsmeasurements(64-bitOS)TraceelementsingarentThinsectionofagarentcontainingslateFullareamapshowssymmetricMncorewithinthecrystalsSelectedgarnetneasuredextensivelywithstrongprimaryfiltertoreducebackgroundandtoavoidBraggdiffractionpeaks370pixel×460pixel→170000pixelmapMeasurementtime:1s/pixelSteps:25μmSummaryUniquespeedandperfoimanceinthedeterminationoftheelementdistributioninlargesamplewithmeasurementtiomesperpixelof0.3msanduptp4MillionpixelsinasingleHyperMapHighspatialresolutiondownto25μmX-rayspotsize,motorsstepsof4μmOptimalfortheanalysisofinhomogeneoussamples,duetobetteridentificationoftherepresentativelocationofinterestNon-destructive,fastanalysisoflargesampleswithoutpreparation,includingsolid,poweroeliquidsamplesQualitativeandquantitativeanalysisofallelementsfromNaupwards,duetovacuumchamber,detectionlimitforheavytraceelementsinthelowppmrangeStandardlessFundamentalParameterquantificationwithtypecalibrationoptionPowerfulSoftwarewithmultipletoolsforoptimaldatamining[詳細(xì)]
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2010-03-23 00:00
實(shí)驗(yàn)操作
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- 微區(qū)XRF(X射線分析顯微鏡)分析紅寶石結(jié)構(gòu)及組成
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應(yīng)用文章
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- 微區(qū)XRF（X射線分析顯微鏡）在金屬殘骸和粒度分析的應(yīng)用
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2010-03-23 00:00
專利
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- 微區(qū)XRF（X射線分析顯微鏡）用于電子工業(yè)的品質(zhì)控制和缺陷
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標(biāo)準(zhǔn)
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- ARTAX系列微區(qū)X射線熒光光譜儀產(chǎn)品樣冊(cè)
- ARTAX系列微區(qū)X射線熒光光譜儀產(chǎn)品樣冊(cè)[詳細(xì)]
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2016-10-19 17:34
產(chǎn)品樣冊(cè)
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- 布魯克 M4 TORNADO 高性能微區(qū)X射線熒光成像光譜儀
- 布魯克 M4 TORNADO 高性能微區(qū)X射線熒光成像光譜儀[詳細(xì)]
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2025-05-26 09:54
產(chǎn)品樣冊(cè)
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微焦點(diǎn)X射線成像系統(tǒng)- 微焦點(diǎn)X射線成像系統(tǒng)[詳細(xì)]
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2024-09-28 00:39
應(yīng)用文章
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德國(guó)布魯克微區(qū)X射線熒光能譜儀M4 TORNADO- 小麥元素分布檢測(cè)-德國(guó)布魯克微區(qū)X射線熒光能譜儀M4TORNADOElementalDistributionExaminationonWheatSeedSamplesMeasurementConditionCustomerSampleObjective:ElementaldistributionexaminationofMn,Fe,Zn,Cu,Cd,P,S,Konwheatseedsamples(n=8,bothtransverseandlongitudinalsectionsfor4setsamples),asperreceived.LeftImage:Wheatseedsampleinnon-embedded,longitudinalandtransverseformrespectivelyRightImage:Samples(N=8)LoadingintotheM4SampleChamberAnalysisResult(a)HOSUT2–LongitudinalSectionCameraImage–10xmagnification(Left)andElementalMapping(Right)ofWheatSeedSample“HOSUT2Longitudinalsection”withcombinationofMn,Fe,Zn,Cu,Cd,P,SandKelement.IndividualElementalMappingofZn,FeandMnrespectivelyElementalMappingof(P+S),KandCurespectivelyAnalysisResult(b)HOSUT3–LongitudinalSectionCameraImage–10xmagnification(Left)andElementalMapping(Right)ofWheatSeedSample“HOSUT3Longitudinalsection”withcombinationofMn,Fe,Zn,Cu,P,SandKelement.IndividualPElementalMapping(Left)and“FalseColorDisplay”IndividualPElementalDistributionMapping(Right)onWheatSeed‘HOSUT3–LongitudinalSection’“FalseColorDisplay”:PhosphorusIntensitySaturationcorrelationineachmappingpixel.Forinstance,thered/blackareaiscorrelatedwithlow/nosulfurconcentration;Thephosphoruscontentisfoundhigherinblue/whiteareaascomparedtogreenarea,referringtotheintensitycolorindicatoronrightside.ElementalMappingof(K+S)and(Mn+Fe+Zn)respectivelyConclusionsAsdemonstrated,M4TornadoisabletoperformquickandnondestructivelyelementalmappinganalysisforexaminingvariouselementdistributiononwheatseedSamplesincludingthefollowingcapabilities:1.Highnumberofsamplesloadingatonetimewithlargesamplechamber2.VaryingElementalDistributionStudyincludingP,S,K,Mn,Fe,ZnandCuonwheatseedSamples3.“FalseColorDisplay”functionmodehelpsinelementdistributionexaminationtofurtherextent[詳細(xì)]
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產(chǎn)品樣冊(cè)
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2024-09-15 17:50
選購(gòu)指南
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- X射線分析在電子工業(yè)的應(yīng)用
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2024-09-22 23:59
安裝說明
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- 韓國(guó)微先鋒X射線測(cè)厚儀/熒光測(cè)厚儀XRF-2000
- 韓國(guó)微先鋒X射線測(cè)厚儀/熒光測(cè)厚儀XRF-2000[詳細(xì)]
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2024-09-14 01:07
產(chǎn)品樣冊(cè)
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2008-07-11 00:00
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