Ellipsometry is a very versatile optical technique that has applications in many different fields, from the micro electronics and semiconductor industries (for characterizing oxides or photoresists on silicon wafers, for ex ample) to biology. This very sensitive measurement technique provides unequalled capabilities for thin film metrology, and has the advantage that it is non-destructive as it uses polarized light to probe the dielectr properties of a sample. 在線橢偏儀 In-situ series 智能型多功能橢偏儀Smart SE 一鍵式全自動快速橢偏儀 Auto SE 研究級全自動橢偏儀UVISEL 2 研究級經(jīng)典型橢偏儀 UVISEL