The X-ray diffraction (XRD) pattern was obtained on a Thermo ARL XTRA X-ray diffractometer with Cu K radiation ì 1.54178 ?). In situ XRD characterization was performed n a high-temperature attachment of the X-ray diffractometer. ... The X-ray diffraction (XRD) pattern was obtained on a
Thermo ARL XTRA X-ray diffractometer with Cu K radiation
ì 1.54178 ?). In situ XRD characterization was performed
n a high-temperature attachment of the X-ray diffractometer.
Transmission electron microscopy (TEM) observation was
performed with a JEOL JEM 2010 high-resolution transmission
electron microscope (HRTEM) operated at 200 kV. The UV
vis diffuse reflectance spectrum (DRS) was obtained from a
Perkin-Elmer Lambda 900 UV vis spectroscopy machine. The
precursor was characterized by Fourier transform infrared (FT-
R) spectroscopy on a Perkin-Elmer Spectrum One FT-IR
machine by using the KBr pellets method. 展開