In this news letter we will inform about how you can extract that extra information fromyour samples by combining Raman, FT-IR, NSOM (NearField Scanning OpticalMicroscopy) and AFM (Atomic Force Microscopy). We also have an interesting Ramanapplicationpresented by conservator Cecilia Rönnerstam, National Museum of Fine Arts inStockholm. Nanonics原子力顯微鏡與拉曼光譜儀Smiths紅外和SEM連用一體機(jī)
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