微區(qū)XRF（X射線分析顯微鏡）的指紋圖像 The fast and non-destructive elemental analysis provided by x-ray fluorescence (XRF), has long been known as a useful tool for forensic science. As microscopic capabilities in the technique have advanced, so its suitability to forensic analysis has increased, now allowing accurate analysis of minute material fragments (see Figure 1) such as paint chips, metals, glasses, and gun shot residues. 請發(fā)郵件至info-sci.cn@horiba.com，直接索取更多應(yīng)用案例 X射線熒光分析顯微鏡 X射線熒光分析顯微鏡