Characterization. X-ray powder diffraction (XRD) pattern of the products was recorded on a Rigaku (Japan) D/max-?A X-ray diffractometer equipped with graphite monochromatized Cu KR radiation (ì ) 1.54178 ?). The transmissio... Characterization. X-ray powder diffraction (XRD) pattern
of the products was recorded on a Rigaku (Japan) D/max-?A
X-ray diffractometer equipped with graphite monochromatized
Cu KR radiation (ì ) 1.54178 ?). The transmission electron
microscopy (TEM) images and selected-area electron diffraction
(SAED) patterns were captured on a Hitachi model H-800
instrument at an accelerating voltage of 200 kV. High-resolution
transmission electron microscopy (HRTEM) images and SAED
patterns were obtained on JEOL-2010 transmission electron
microscope at an accelerating voltage of 200 kV. The Raman
spectrum was recorded with a LABRAM-HR confocal Laser
MicroRaman spectrometer with 514.5 nm radiation from an
argon laser at room temperature. X-ray photoelectron spectra
(XPS) were obtained from an ESCALAB MK II X-ray photoelectron
spectrometer by using nonmonochromatized Mg Kα
X-ray as the excitation source with an overall energy resolution
of 1.0 eV. 展開